SEM/EDS

JEOL JSM-6360LV Scanning Electron Microscope

A fully digital Scanning Electron Microscope, capable of usable magnifications of up to 100,000 times in Secondary Imaging mode with 3.0-nm resolution for topographic imaging. Three modes of Backscattered Electron imaging also provide atomic number contrast and topographical imaging in high and low vacuum modes. Allowing a small amount of air into the chamber (Low Vacuum mode) neutralizes charges on uncoated, non-conducting materials so that gold coating is not required for plastics, ceramics, and other dielectrics. Max sample size: 4 inches dia. x 2.5 inches high.

The electron microscope uses a focused beam of high-energy electrons to generate a variety of signals from scanning the surface of a sample. These include:

  • Secondary Electrons for topographical imaging,
  • Backscattered Electrons for Atomic Number contrast imaging, and
  • Characteristic X-rays for chemical analysis by Energy Dispersive Spectrometry

Secondary Electron Imaging

The most common form of imaging, Secondary Electron Imaging (SEI) produces a high resolution image of the surface topography of a specimen. In failure analysis, this usually provides enough information to determine the mechanism of failure of a material. The SEM provides several advantages over light microscopes including greater magnification, greater depth of field, and finer magnification control.

Cast Tungsten carbide - 200X

Cast Tungsten carbide – 200X

Intergranular fracture of steel by hydrogen - 1000X

Intergranular fracture of steel by hydrogen – 1000X

Backscattered Electron Imaging

Three modes of Backscattered electron imaging are available in high or low vacuum modes at 4.0 nm resolution:

  • Compo (for Composition): Atomic number contrasting imaging. Lighter elements appear darker while heavier elements appear brighter.
  • Topo (for Topography): Surface topography imaging similar to Secondary Electron imaging

Shadow: Combination of Compo & Topo with illumination from the side.

SE Image of slag in a stainless steel weld - 330X

SE Image of slag in a stainless steel weld – 330X

BS (Compo) Image of slag particle in a stainless steel weld - 330X

BS (Compo) Image of slag particle in a stainless steel weld – 330X

BS (Topo) Image of over-torqued PVC fitting - 110X

BS (Topo) Image of over-torqued PVC fitting – 110X

BS (Shadow) Image of WC powder - 150X

BS (Shadow) Image of WC powder – 150X

 

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