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Houston Electron Microscopy, Inc. is equipped with JEOL JSM-6360LV Scanning Electron Microscope, A fully digital Scanning Electron Microscope, capable of usable magnifications of up to 100,000 times in Secondary Imaging mode with 3.0-nm resolution for topographic imaging.

 

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Houston Electron Microscopy
281-888-4261 or 281-704-0188

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