Scanning Electron Microscope and
Energy Dispersive Spectrometer

Houston Electron Microscopy has a State of the art SEM/EDS system with features such as variable pressure, secondary and backscatter imaging, x-ray mapping, particle analysis, and its capabilities are augmented with the EDS. The EDS or EDX  with SDD technology  for elemental analysis of anything viewed under the SEM.

SEM/EDS Analysis

With SEM/EDS analysis, it is possible to identify microscopic particles or contamination causing process problems from a variety of signals such as:

Secondary Electrons - for topographical imaging,
Backscattered Electrons - for Atomic Number contrast imaging, and
Characteristic X-rays - for chemical analysis by Energy Dispersive Spectrometry

 

Elemental and compound information can be viewed in several formats:

elemental spectrums to identify the elements present,
quantitative atomic and weight percent calculations, and
x-ray mapping which combines the image with its chemical composition.

New ColorSEM

Additionally our new ColorSEM enables a more thorough examination.

Advantages

• Experience
• Modern SEM/EDS System
• No hidden charges
• Easy and quick availability
• Conveniently located in Northwest Houston

Curious on how the Scanning Electron Microscope Works? What about how the Energy Dispersive X-Ray Spectroscopy work? Houston Electron Microscopy invites you to tour our lab and see our SEM/EDS system in action. Come and find out how we can answer your materials questions.

 

Houston Electron Microscopy
281-888-4261 or 281-704-0188

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