Houston Electron Microscopy

We get answers
281.888.4261

Scanning Electron Microscopy

Secondary Electron Imaging

Houston Electron Microscopy is equiped with a JEOL JSM-6360LV Scanning Electron Microscope. With it, we are able to capture images in high or low vacuum mode. High vacuum imaging provides the highest resolution at 3.0 nm. For most aplications, observations are performed at magnifications in the range of 1000X to 10,000X. However, magnifications as high as 100,000X can be obtained using Secondary Electron imaging.

  • Scanning Elecctron Microscopy - elemental mapping

Services & Applications

  • Failure Analysis of Metals
  • Failure Analysis of Non Metals
  • Metallography
  • Geology
  • Microstructural Analysis
  • Element Analysis
  • Element mapping
  • PDC Measurement and Analysis
  • Phase Analysis and Measurements
  • Contamination Debris in Oil Samples
  • Coating of plastics and metals analysis

We get answers

Houston Electron Microscopy
281-888-4261 or 281-704-0188

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